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Optimizing PCB and IC Substrate Manufacturing with KLA YieldStar Chemistry Process Control

Enhancing Plating and Coating Chemistries

KLA's chemistry process control products, including the KLA YieldStar, play a vital role in optimizing various processes within the printed circuit board (PCB) and IC substrate manufacturing environments. These products facilitate the analysis and monitoring of plating and coating chemistries, ensuring the highest quality outcomes. Through the utilization of a patented cyclic voltametric stripping (CVS) technique, the KLA YieldStar effectively analyzes PCB plating baths, providing crucial insights to support optimal plating processes.

Ensuring Quality Metallization and Readiness for Solder

Moreover, the systems integrated within the KLA YieldStar are instrumental in testing the quality of metallization on plated components or wires. This assessment is crucial for PCB manufacturers as it helps in ensuring readiness for subsequent soldering and wirebonding processes. By providing real-time information on the metallization quality, manufacturers can make timely adjustments to maintain the highest standards and efficiency in their production.

Online Monitoring and Process Control

Additionally, KLA's chemistry process control products feature advanced chemical management systems that enable online monitoring and control for plating processes during the high-volume manufacturing of IC substrates and PCBs. These systems offer real-time insights into the plating conditions, allowing manufacturers to make immediate adjustments to optimize processes and enhance overall efficiency. The data generated by these monitoring systems empowers manufacturers to streamline operations, minimize waste, and achieve higher yields.

Optimizing Processes for Higher Yield

By leveraging the capabilities of the KLA YieldStar and related chemistry process control products, PCB and IC substrate manufacturers can refine their operational processes, ultimately leading to higher yields and enhanced quality outputs. The comprehensive insights provided by these systems not only optimize current manufacturing processes but also pave the way for innovative advancements within the industry. With a focus on continuous improvement and efficiency, KLA's chemistry process control solutions are indispensable tools for manufacturers seeking to stay at the forefront of PCB and IC substrate manufacturing.

Revolutionizing Solder Mask Imaging with KLA YieldStar Direct Imaging Solutions

Highly Accurate Direct Imaging for Solder Mask Applications

KLA's direct imaging (DI) solutions for solder mask (SM) go beyond traditional imaging techniques to offer high-accuracy, high-quality imaging with impressive production throughput capabilities. These cutting-edge solutions cater to a wide range of solder mask designs, from simple to highly complex configurations. Whether it's high-density interconnects (HDI), multi-layer boards (MLB), flexible printed circuit boards (FPCB), or specialized white solder mask applications like miniLED backlight units, KLA's solutions ensure consistently precise imaging quality at a low total cost of ownership.

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Maximizing Chip Manufacturing Efficiency with KLA YieldStar Metrology Solutions

Archer™ Overlay Metrology Systems

KLA's Archer™ 750 overlay metrology system offers precise on-product overlay error feedback, crucial for achieving fast technology ramps and stable production of cutting-edge memory and logic devices. With wavelength tunability and 10nm resolution, this system ensures accurate overlay error measurements even in the presence of production process variations. The advanced algorithms and rAIM® overlay target design enhance the correlation between target and device overlay errors, enabling lithographers to accurately track device overlay performance.

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Revolutionizing Advanced Packaging with KLA YieldStar Wafer Processing Systems

KLA YieldStar Wafer Processing Systems Overview

KLA's YieldStar Wafer Processing Systems offer cutting-edge plasma etch and deposition process technologies tailored for advanced packaging schemes. From High-Density Fan-Out Wafer-Level Packaging (FOWLP) to intricate 3D packages featuring stacked die interconnected with through-silicon vias (TSV), KLA's solutions cater to a wide array of advanced packaging needs. These systems leverage KLA's extensive expertise in silicon etching, providing innovative plasma dicing solutions for dicing before or after grind processes on wafers up to 300mm in diameter. With a focus on precise process control and reliable production-proven methods, KLA enables chip manufacturers to reduce production costs while enhancing reliability, performance, and the integration of multiple functions.

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Empowering IoT Device Production with KLA YieldStar

Meeting the Demand for IoT Devices

In today's technological landscape, the Internet of Things (IoT) has propelled semiconductors to the forefront of every industry. The demand for low-cost devices with high-volume production capabilities and a variety of chip types, including those designed for 200mm and large design-rule nodes, has skyrocketed. To cater to this demand, fabs are upgrading and utilizing certified and remanufactured tools, originally introduced for cutting-edge design nodes. This surge in demand is fueled by the necessity for more mobile, automotive, and industrial IoT devices.

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Accelerating Reliability for Automotive Electronics with KLA YieldStar

Continuous Improvement Program for Automotive Fabs

Semiconductors and electronic components play a crucial role in driving innovation within the automotive industry. To ensure the reliability and quality of automotive electronics, KLA YieldStar offers a Continuous Improvement Program (CIP). This program leverages unpatterned wafer defect inspection to pinpoint the specific process tools responsible for defects. By implementing a tool monitoring CIP, automotive fabs can establish concrete targets for reducing process defects that impact reliability. This proactive approach allows manufacturers to enhance the overall quality of automotive electronics and drive continuous improvement.

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