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Revolutionizing Advanced Packaging with KLA YieldStar Wafer Processing Systems

KLA YieldStar Wafer Processing Systems Overview

KLA's YieldStar Wafer Processing Systems offer cutting-edge plasma etch and deposition process technologies tailored for advanced packaging schemes. From High-Density Fan-Out Wafer-Level Packaging (FOWLP) to intricate 3D packages featuring stacked die interconnected with through-silicon vias (TSV), KLA's solutions cater to a wide array of advanced packaging needs. These systems leverage KLA's extensive expertise in silicon etching, providing innovative plasma dicing solutions for dicing before or after grind processes on wafers up to 300mm in diameter. With a focus on precise process control and reliable production-proven methods, KLA enables chip manufacturers to reduce production costs while enhancing reliability, performance, and the integration of multiple functions.

SPTS Osprey® PECVD for Advanced Packaging

SPTS offers the Osprey® PECVD system designed specifically for advanced packaging applications. This system excels in low-temperature deposition processes that are compatible with 300mm bonded substrates and molds. The Osprey® PECVD system facilitates the production of high-quality dielectric films at remarkably low deposition temperatures, starting from 110°C. With the capability to deposit SiN-SiO stacks in the same chamber, this system ensures high reliability in electrical performance with excellent stability over time. Additionally, the system allows for fine-tuning of film and stack stress over a wide range, offering optimized chamber hardware to achieve the lowest within-wafer stress range in comparison to other PECVD systems. Single-wafer and multi-wafer degas options are available, along with the deposition of advanced dielectric films like SiO, TEOS SiO, and SiCN for hybrid bonding and inter-die gap-fill applications.

SPTS Omega® Plasma Etch for Silicon Processing

The SPTS Omega® plasma etch systems, particularly the Rapier™ range of process modules, are tailored for high-rate silicon etching in advanced packaging applications. These modules are instrumental in creating vertical or tapered, high aspect ratio via holes or slots through silicon wafers or interposers used in 2.5D/3D-IC packaging. Furthermore, Rapier™ etch modules are ideal for blanket via reveal etching to expose Cu-filled vias from the backside of the wafer. The Rapier™ XE process module offers superior recipe tuneable uniformity and boasts an etch rate that is significantly faster than competing systems. This process can also be utilized for extreme wafer thinning down to 5µm or even 0.5µm by incorporating an etch stop layer. KLA provides patent-protected end-point solutions for TSV etching, via reveal, and extreme thinning processes to ensure optimal throughput and yields in high-volume production.

SPTS Mosaic™ Plasma Dicing for Die Singulation

SPTS Mosaic™ plasma dicing systems introduce an innovative alternative to mechanical saw or laser technologies for singulating die from silicon wafers, especially those up to 300mm in size mounted on frames. This dry chemical process minimizes damage and enhances die strength, while preventing particulate contamination. Notably, plasma dicing is highly beneficial for thin wafers or those containing fragile low k films, as well as for die to wafer bonding applications. The parallel processing nature of plasma dicing ensures substantial throughput, yield, and cost advantages, particularly for dicing small die and thin wafers. Narrower dicing lanes allow for more die per wafer, with the flexibility to accommodate varied die shapes for optimized wafer layouts.

SPTS Sigma® PVD for Metal Deposition in Advanced Packaging

SPTS Sigma® PVD systems specialize in depositing metals like Au, Al, Ti, TiW, and Cu onto Si or mold wafers, addressing the technical challenges posed by advanced packaging technologies incorporating organic passivation and new substrate materials. By incorporating novel degas and pre-clean technology, the Sigma® PVD systems consistently achieve low Rc values while offering a 2 times throughput advantage compared to other PVD systems. In 2.5D and 3D-IC applications, KLA's Advanced Hi-Fill® Ionized PVD source delivers exceptional Cu barrier/seed coverage in high aspect ratio TSVs, ensuring top-notch performance for metal deposition in advanced packaging processes.

Empowering IoT Device Production with KLA YieldStar

Meeting the Demand for IoT Devices

In today's technological landscape, the Internet of Things (IoT) has propelled semiconductors to the forefront of every industry. The demand for low-cost devices with high-volume production capabilities and a variety of chip types, including those designed for 200mm and large design-rule nodes, has skyrocketed. To cater to this demand, fabs are upgrading and utilizing certified and remanufactured tools, originally introduced for cutting-edge design nodes. This surge in demand is fueled by the necessity for more mobile, automotive, and industrial IoT devices.

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Accelerating Reliability for Automotive Electronics with KLA YieldStar

Continuous Improvement Program for Automotive Fabs

Semiconductors and electronic components play a crucial role in driving innovation within the automotive industry. To ensure the reliability and quality of automotive electronics, KLA YieldStar offers a Continuous Improvement Program (CIP). This program leverages unpatterned wafer defect inspection to pinpoint the specific process tools responsible for defects. By implementing a tool monitoring CIP, automotive fabs can establish concrete targets for reducing process defects that impact reliability. This proactive approach allows manufacturers to enhance the overall quality of automotive electronics and drive continuous improvement.

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Enhancing Wafer Quality with KLA YieldStar Metrology Solution

Wafer Manufacturing Portfolio Overview

KLA's wafer manufacturing portfolio comprises defect inspection, review, metrology, and data management systems that play a crucial role in ensuring quality throughout the wafer fabrication process. These specialized tools not only assess wafer surface quality but also detect, count, and bin defects during production, thereby significantly contributing to outgoing wafer qualification. Moreover, wafer geometry systems ensure that the wafer shape remains extremely flat and uniform in thickness, with precise control over wafer shape topography. Additionally, data analysis and management systems proactively identify and address wafer/substrate fabrication process excursions that could potentially lead to yield loss.

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Enabling 5G Connectivity with KLA YieldStar

The Impact of 5G on Connectivity

The evolution towards 5G technology signifies a significant shift in how our interconnected systems function. Beyond enhancing the speed of mobile browsing, 5G plays a pivotal role in facilitating seamless interactions between various systems, empowered by advancements in artificial intelligence. For instance, V2X communication in vehicles utilizes 5G to enhance safety and optimize traffic management through constant monitoring and communication with the environment. Furthermore, the utilization of KLA's cutting-edge technologies enables the production of thinner and lighter advanced displays crucial for numerous 5G devices.

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Enhancing Advanced Wafer-Level Packaging with KLA YieldStar Technology

Kronos™ 1190: Leading the Way in Wafer-Level Packaging Inspection

The Kronos™ 1190 patterned wafer inspection system from KLA YieldStar is at the forefront of wafer-level packaging inspection technology. With high resolution optics, this system offers best-in-class sensitivity to critical defects, making it a valuable tool for process development and production monitoring in advanced wafer-level packaging applications such as 3D IC and high-density fan-out. The system integrates Artificial Intelligence (AI) through DefectWise®, boosting sensitivity, productivity, and classification accuracy to tackle overkill and defect escape challenges. Additionally, DesignWise® refines inspection areas based on direct design input, resulting in reduced nuisance factors and improved inspection efficiency. The Kronos™ 1190 system is capable of inspecting bonded, thinned, warped, and diced substrates, providing cost-effective defect inspection down to 150nm in critical process steps like post-dicing, pre-bonding, and patterning of Cu pads, Cu pillars, bumps, through-silicon vias (TSVs), and redistribution layers (RDL).

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