Innovative Test and Diagnosis Capabilities
The Synopsys TestMAX family of products provides an array of innovative test and diagnosis capabilities for all digital, memory, and analog sections of semiconductor devices. Specifically designed to address the challenges of automotive test and functional safety, these solutions offer cutting-edge technologies that enhance test bandwidth and efficiency by leveraging high-speed interfaces found in modern designs.
Seamless Integration and Comprehensive Support
As a crucial component of the Silicon Lifecycle Management Family, Synopsys TestMAX features a robust and highly configurable test automation flow. This flow seamlessly integrates all capabilities of Synopsys TestMAX, including early validation of complex DFT logic with full RTL integration. Moreover, the platform maintains physical, timing, and power awareness through direct links to the Synopsys Digital Design Family. By offering comprehensive support for early testability analysis, hierarchical ATPG compression, physically-aware diagnosis, logic BIST, memory self-test and repair, and analog fault simulation, the Synopsys TestMAX product family ensures effective testing for even the most demanding semiconductor applications.
Driving Innovation in Test Technology
Synopsys demonstrated its commitment to innovation in test technology at ITC 2023 by introducing groundbreaking solutions such as Synopsys TSO.ai and Silicon.da. These advancements have revolutionized the industry, empowering customers to tackle their toughest test challenges with Synopsys' state-of-the-art offerings. The video showcased the impact of these pioneering technologies on advancing the field of test and AI, setting new standards in semiconductor testing.