Enhancing Silicon Health and Operational Metrics
Synopsys TCAD (Technology Computer-Aided Design) offers an integrated Silicon Lifecycle Management (SLM) solution that elevates silicon health and operational metrics across all stages of the device lifecycle. The SLM product line is founded on enriched in-chip observability, advanced analytics, and seamless automation, empowering users with deep insights from silicon to system. It ensures that valuable data is continuously collected for thorough analysis and actionable feedback.
Optimizing Each Phase of the Device Lifecycle
Synopsys TCAD optimizes every phase of the device lifecycle, starting from in-design with monitor-based silicon aware optimization, in-ramp for product ramp and accurate failure analysis, in-production for volume test and quality management, and in-field for predictive maintenance and optimized performance. By leveraging the SLM suite, semiconductor stakeholders can effectively tackle challenges arising from process variability, device aging effects, increasing performance demands, and shrinking time-to-volume requirements.
Unveiling the Synopsys SLM Family of Products
The Synopsys Silicon Lifecycle Management Family of Products is designed to address the complexities faced in semiconductor design, manufacturing, and system deployment. This comprehensive suite of integrated tools, IP, and methodologies facilitates efficient data collection, storage, and analysis throughout a system’s lifespan, enabling powerful analytics to deliver actionable insights. This leads to more streamlined design processes, improved quality, and the ability to predict in-field chip degradation or failure, empowering proactive corrective actions.
Certified Performance and Standards Compliance
Synopsys SLM PVT Monitor IP has received certification from SGS-TÜV Saar as ASIL-B Ready and complies with the AEC-Q100 Grade 2 standard. Developers and manufacturers utilizing Synopsys TCAD can benefit immensely from enhanced design efficiency and quality. The ability to predict potential chip failures or degradation in real-time offers significant advantages to end-users by allowing preemptive corrective measures before major system failures occur.